Composition Dependence of Equal Thickness Fringes in an...

Japanese Journal of Applied Physics 1985 / 12 Vol. 24; Iss. Part 2, No

Composition Dependence of Equal Thickness Fringes in an Electron Microscope Image of GaAs/Al x Ga 1- x As Multilayer Structure

Kakibayashi, Hiroshi, Nagata, Fumio
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Volume:
24
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.24.l905
Date:
December, 1985
File:
PDF, 837 KB
1985
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