In-Depth Profile Measurements of Cr-Related Luminescence...

Japanese Journal of Applied Physics 1985 / 11 Vol. 24; Iss. Part 1, No

In-Depth Profile Measurements of Cr-Related Luminescence Lines in GaAs

Fujiwara, Yasufumi, Kojima, Atsushi, Nishino, Taneo, Hamakawa, Yoshihiro
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Volume:
24
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.24.1479
Date:
November, 1985
File:
PDF, 780 KB
1985
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