High Contrast TEM Observation of Lattice Image of GaAs-Al...

Japanese Journal of Applied Physics 1985 / 9 Vol. 24; Iss. Part 2, No

High Contrast TEM Observation of Lattice Image of GaAs-Al 0.28 Ga 0.72 As Superlattice with [100] Electron Beam Incidence

Suzuki, Yoshifumi, Okamoto, Hiroshi
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Volume:
24
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.24.l696
Date:
September, 1985
File:
PDF, 1.13 MB
1985
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