[IEEE 2006 8th International Conference on Actual Problems of Electronic Instrument Engineering - Novosibirsk, Russia (2006.09.26-2006.09.28)] 2006 8th International Conference on Actual Problems of Electronic Instrument Engineering - Distribution of Statistics of Chi-Square Goodness-of-Fit Tests for Small Samples
Lemeshko, S.B.Year:
2006
Language:
english
DOI:
10.1109/apeie.2006.4292559
File:
PDF, 90 KB
english, 2006