[IEEE ISIE 2001. 2001 IEEE International Symposium on Industrial Electronics Proceedings - Pusan, South Korea (12-16 June 2001)] ISIE 2001. 2001 IEEE International Symposium on Industrial Electronics Proceedings (Cat. No.01TH8570) - An improved tamper-detection method for digital images
Intaek Kim,, Seung-Soo Han,, Jung Hwa Shin,Volume:
1
Year:
2001
Language:
english
DOI:
10.1109/ISIE.2001.931787
File:
PDF, 364 KB
english, 2001