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A high resolving power ion selector for post-source decay measurements in a reflecting time-of-flight mass spectrometer
C. K. G. Piyadasa, P. Håkansson, T. R. Ariyaratne, D. F. BarofskyVolume:
12
Year:
1998
Language:
english
Pages:
10
DOI:
10.1002/(sici)1097-0231(19981130)12:223.0.co;2-c
File:
PDF, 156 KB
english, 1998