Defect Influence on the Electrical Properties of 4H-SiC...

Materials Science Forum 2004 Vol. 457-460

Defect Influence on the Electrical Properties of 4H-SiC Schottky Diodes

Scaltrito, Luciano, Celasco, E., Porro, Samuele, Ferrero, Sergio, Giorgis, Fabrizio, Pirri, C. Fabrizio, Perrone, Denis, Meotto, Umberto M., Mandracci, P., Richieri, G., Merlin, Luigi, Cavallini, Anna
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Volume:
457-460
Year:
2004
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.457-460.1081
File:
PDF, 429 KB
english, 2004
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