Probing dopant incorporation in InAs/GaAs QDIPs by...

Probing dopant incorporation in InAs/GaAs QDIPs by polarization-dependent Fourier transform infrared spectroscopy

Z.Y. Zhao, C. Yi, A.D. Stiff-Roberts, A.J. Hoffman, D. Wasserman, C. Gmachl
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Volume:
51
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.infrared.2007.04.002
File:
PDF, 428 KB
english, 2007
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