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The low frequency behaviour in high frequency capacitance–voltage characteristics due to contribution of band-to-band tunnelling and generation–recombination in Hg0.75Cd0.25Te MIS capacitors
R.K. Bhan, Raghvendra Sahai Saxena, N.K. Saini, L. Sareen, R. Pal, R.K. SharmaVolume:
54
Year:
2011
Language:
english
Pages:
3
DOI:
10.1016/j.infrared.2011.05.001
File:
PDF, 339 KB
english, 2011