Si K -edge X-ray absorption...

Canadian Journal of Physics 1992 / 10 Vol. 70; Iss. 10-11

Si K -edge X-ray absorption fine structure studies of porous silicon

Sham, T. K., Feng, X. H., Jiang, D. T., Yang, B. X., Xiong, J. Z., Bzowski, A., Houghton, D. C., Bryskiewicz, B., Wang, E.
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Volume:
70
Journal:
Canadian Journal of Physics
DOI:
10.1139/p92-128
Date:
October, 1992
File:
PDF, 316 KB
1992
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