Radiation hardness of the electrical properties of carbon nanotube network field effect transistors under high-energy proton irradiation
Hong, Woong-Ki, Lee, Chongoh, Nepal, Dhriti, Geckeler, Kurt E, Shin, Kwanwoo, Lee, TakheeVolume:
17
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/17/22/023
Date:
November, 2006
File:
PDF, 702 KB
english, 2006