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Observation of latent heavy-ion tracks in GeS by transmission electron microscopy
Scholz, R., Vetter, J., Hopfe, S.Volume:
126
Language:
english
Journal:
Radiation Effects and Defects in Solids
DOI:
10.1080/10420159308219725
Date:
March, 1993
File:
PDF, 1.15 MB
english, 1993