Dynamic Nanoimpedance Characterization of the Atomic Force Microscope Tip-Surface Contact
Tobiszewski, Mateusz Tomasz, Zieliński, Artur, Darowicki, KazimierzVolume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927613013895
Date:
February, 2014
File:
PDF, 334 KB
english, 2014