Analysis of the adhesion effect in RF-MEMS switches using...

Analysis of the adhesion effect in RF-MEMS switches using atomic force microscope

Birleanu, Corina, Pustan, Marius
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Volume:
82
Language:
english
Journal:
Analog Integrated Circuits and Signal Processing
DOI:
10.1007/s10470-014-0481-z
Date:
March, 2015
File:
PDF, 1.37 MB
english, 2015
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