Ion-induced X-ray measurements of proton dechanneling in...

Ion-induced X-ray measurements of proton dechanneling in silicon covered with amorphous layers

Kerkow, H., Kreysch, G.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
54
Language:
english
Journal:
Radiation Effects
DOI:
10.1080/00337578108210041
Date:
January, 1981
File:
PDF, 458 KB
english, 1981
Conversion to is in progress
Conversion to is failed