Applying grazing incidence X-ray reflectometry (XRR) to...

Journal of Colloid and Interface Science 2007 Vol. 306; Iss. 2

Applying grazing incidence X-ray reflectometry (XRR) to characterising nanofilms on mica

Wuge H. Briscoe, Meng Chen, Iain E. Dunlop, Jacob Klein, Jeffrey Penfold, Robert M.J. Jacobs
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Volume:
306
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.jcis.2006.10.031
File:
PDF, 563 KB
english, 2007
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