The in situ characterization and structuring of...

Journal of Colloid and Interface Science 2008 Vol. 328; Iss. 2

The in situ characterization and structuring of electrografted polyphenylene films on silicon surfaces. An AFM and XPS study

Achraf Ghorbal, Federico Grisotto, Marion Laudé, Julienne Charlier, Serge Palacin
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
328
Year:
2008
Language:
english
Pages:
6
DOI:
10.1016/j.jcis.2008.09.033
File:
PDF, 1.09 MB
english, 2008
Conversion to is in progress
Conversion to is failed