Analysis of Deviation of Threshold Voltage from Hole...

Japanese Journal of Applied Physics 2006 / 11 Vol. 45; Iss. 11

Analysis of Deviation of Threshold Voltage from Hole Accumulation Model at High Excitation

Taguchi, Hirohisa, Murakami, Hiroaki, Oura, Mashashi, Iida, Tsutomu, Takanashi, Yoshifumi
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Volume:
45
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.45.8549
Date:
November, 2006
File:
PDF, 218 KB
english, 2006
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