FexSi grown with mass-analyzed low-energy dual ion beam...

Journal of Crystal Growth 2004 Vol. 263; Iss. 1-4

FexSi grown with mass-analyzed low-energy dual ion beam deposition

Lifeng Liu, Nuofu Chen, Fuqiang Zhang, Chenlong Chen, Yanli Li, Shaoyan Yang, Zhikai Liu
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Volume:
263
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.jcrysgro.2003.11.092
File:
PDF, 225 KB
english, 2004
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