Growth and characterization of InAlP/InGaAs double barrier...

Journal of Crystal Growth 2004 Vol. 272; Iss. 1-4

Growth and characterization of InAlP/InGaAs double barrier RTDs

S. Neumann, P. Velling, W. Prost, F.-J. Tegude
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Volume:
272
Year:
2004
Language:
english
Pages:
4
DOI:
10.1016/j.jcrysgro.2004.08.120
File:
PDF, 188 KB
english, 2004
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