Characterisation of quaternary AlInGaN thick layers and...

Characterisation of quaternary AlInGaN thick layers and quantum wells grown by MOVPE

V. Perez-Solorzano, A. Groening, R. Haerle, H. Schweizer, M. Jetter
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Volume:
272
Year:
2004
Language:
english
Pages:
7
DOI:
10.1016/j.jcrysgro.2004.08.123
File:
PDF, 296 KB
english, 2004
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