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Role of point defects on the optical properties of self-assembled Ge/Si hut clusters
T.K. Nguyen-Duc, V. Le Thanh, Lam. H. Nguyen, P. Boucaud, V. Yam, D. Bouchier, F.A. d’Avitaya, J. DerrienVolume:
275
Year:
2005
Language:
english
Pages:
1
DOI:
10.1016/j.jcrysgro.2004.11.123
File:
PDF, 342 KB
english, 2005