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Comparative study on residual strain and thermal stress in 4-in GaAs crystals grown by LEC and VB techniques
Tomohiro Kawase, Masami Tatsumi, Masayoshi YamadaVolume:
275
Year:
2005
Language:
english
Pages:
1
DOI:
10.1016/j.jcrysgro.2004.11.289
File:
PDF, 289 KB
english, 2005