Infrared measurement of Ge concentration in CZ–Si

Infrared measurement of Ge concentration in CZ–Si

Zhongwei Jiang, Weilian Zhang, Xinhuan Niu, Liqin Yan
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Volume:
279
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.jcrysgro.2005.02.021
File:
PDF, 210 KB
english, 2005
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