Characterization and Raman investigations on high-quality ZnO thin films fabricated by reactive electron beam evaporation technique
R. Al Asmar, J.P. Atanas, M. Ajaka, Y. Zaatar, G. Ferblantier, J.L. Sauvajol, J. Jabbour, S. Juillaget, A. FoucaranVolume:
279
Year:
2005
Language:
english
Pages:
9
DOI:
10.1016/j.jcrysgro.2005.02.035
File:
PDF, 336 KB
english, 2005