Local detection of X-ray spectroscopies with an in-situ...

Journal of Instrumentation 2008 / 12 Vol. 3; Iss. 12

Local detection of X-ray spectroscopies with an in-situ Atomic Force Microscope

Rodrigues, M S, Dhez, O, Denmat, S Le, Chevrier, J, Felici, R, Comin, F
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Volume:
3
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/3/12/P12004
Date:
December, 2008
File:
PDF, 483 KB
english, 2008
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