![](/img/cover-not-exists.png)
Monitoring Morphological Changes in 2D Monolayer Semiconductors Using Atom-Thick Plasmonic Nanocavities
Sigle, Daniel O., Mertens, Jan, Herrmann, Lars O., Bowman, Richard W., Ithurria, Sandrine, Dubertret, Benoit, Shi, Yumeng, Yang, Hui Ying, Tserkezis, Christos, Aizpurua, Javier, Baumberg, Jeremy J.Volume:
9
Language:
english
Journal:
ACS Nano
DOI:
10.1021/nn5064198
Date:
January, 2015
File:
PDF, 394 KB
english, 2015