Monitoring Morphological Changes in 2D Monolayer...

ACS Nano 2015 / 01 Vol. 9; Iss. 1

Monitoring Morphological Changes in 2D Monolayer Semiconductors Using Atom-Thick Plasmonic Nanocavities

Sigle, Daniel O., Mertens, Jan, Herrmann, Lars O., Bowman, Richard W., Ithurria, Sandrine, Dubertret, Benoit, Shi, Yumeng, Yang, Hui Ying, Tserkezis, Christos, Aizpurua, Javier, Baumberg, Jeremy J.
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Volume:
9
Language:
english
Journal:
ACS Nano
DOI:
10.1021/nn5064198
Date:
January, 2015
File:
PDF, 394 KB
english, 2015
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