Growth behavior and microstructure of Ge self-assembled...

Growth behavior and microstructure of Ge self-assembled islands on nanometer-scale patterned Si substrate

Tae-Sik Yoon, Zuoming Zhao, Wen Feng, Biyun Li, Jian Liu, Ya-Hong Xie, Du Yeol Ryu, Thomas P. Russell, Hyun-Mi Kim, Ki-Bum Kim
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Volume:
290
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.jcrysgro.2006.02.004
File:
PDF, 488 KB
english, 2006
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