![](/img/cover-not-exists.png)
Stress development during annealing of self-assembled InAs/GaAs quantum dots measured in situ with a cantilever beam setup
D.Z. Hu, D.M. Schaadt, K.H. PloogVolume:
293
Year:
2006
Language:
english
Pages:
4
DOI:
10.1016/j.jcrysgro.2006.06.009
File:
PDF, 276 KB
english, 2006