Stress development during annealing of self-assembled...

Stress development during annealing of self-assembled InAs/GaAs quantum dots measured in situ with a cantilever beam setup

D.Z. Hu, D.M. Schaadt, K.H. Ploog
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Volume:
293
Year:
2006
Language:
english
Pages:
4
DOI:
10.1016/j.jcrysgro.2006.06.009
File:
PDF, 276 KB
english, 2006
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