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Combined annealing temperature and thickness effects on properties of PbZr0.53Ti0.47O3 films on LaNiO3/Si substrate by sol–gel process
G.S. Wang, D. Rémiens, C. SoyerVolume:
293
Year:
2006
Language:
english
Pages:
6
DOI:
10.1016/j.jcrysgro.2006.06.014
File:
PDF, 466 KB
english, 2006