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Influence of V/III flux ratio on electrical properties of AlInGaN/Gan heterostructures grown by MOCVD
Tongjun Yu, Yaobo Pan, Zhijian Yang, Ke Xu, Guoyi ZhangVolume:
298
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.jcrysgro.2006.10.020
File:
PDF, 425 KB
english, 2007