High-resolution X-ray diffraction study of laser lift-off AlGaN/GaN HEMTs grown by MOCVD method
K.K. Leung, C.P. Chan, W.K. Fong, M. Pilkuhn, H. Schweizer, C. SuryaVolume:
298
Year:
2007
Language:
english
Pages:
3
DOI:
10.1016/j.jcrysgro.2006.10.112
File:
PDF, 300 KB
english, 2007