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Robust absolute magnetometry with organic thin-film devices
Baker, W.J., Ambal, K., Waters, D.P., Baarda, R., Morishita, H., van Schooten, K., McCamey, D.R., Lupton, J.M., Boehme, C.Volume:
3
Language:
english
Journal:
Nature Communications
DOI:
10.1038/ncomms1895
Date:
June, 2012
File:
PDF, 840 KB
english, 2012