Growth optimization during III-nitride multiwafer MOVPE using real-time curvature, reflectance and true temperature measurements
F. Brunner, V. Hoffmann, A. Knauer, E. Steimetz, T. Schenk, J.-T. Zettler, M. WeyersVolume:
298
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.jcrysgro.2006.10.186
File:
PDF, 254 KB
english, 2007