A bottom–up multiscale view of point-defect aggregation in...

Journal of Crystal Growth 2007 Vol. 303; Iss. 1

A bottom–up multiscale view of point-defect aggregation in silicon

Talid Sinno
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Volume:
303
Year:
2007
Language:
english
Pages:
7
DOI:
10.1016/j.jcrysgro.2006.11.278
File:
PDF, 878 KB
english, 2007
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