Similarities and differences in sublimation growth of SiC and AlN
B.M. Epelbaum, M. Bickermann, S. Nagata, P. Heimann, O. Filip, A. WinnackerVolume:
305
Year:
2007
Language:
english
Pages:
9
DOI:
10.1016/j.jcrysgro.2007.04.008
File:
PDF, 1.76 MB
english, 2007