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Influence of crystalline defects in Czochralski-grown Si multicrystal on minority carrier lifetime
Toshinori Taishi, Takeshi Hoshikawa, Muneyoshi Yamatani, Katsuhiko Shirasawa, Xinming Huang, Satoshi Uda, Keigo HoshikawaVolume:
306
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.jcrysgro.2007.05.042
File:
PDF, 1005 KB
english, 2007