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Effect of thickness on structural and electrical properties of GaN films grown on SiN-treated sapphire
A. Bchetnia, A. Touré, T.A. Lafford, Z. Benzarti, I. Halidou, M.M. Habchi, B. El JaniVolume:
308
Year:
2007
Language:
english
Pages:
7
DOI:
10.1016/j.jcrysgro.2007.09.006
File:
PDF, 333 KB
english, 2007