Common point defects in as-grown ZnO substrates studied by...

Common point defects in as-grown ZnO substrates studied by optical detection of magnetic resonance

N.T. Son, I.G. Ivanov, A. Kuznetsov, B.G. Svensson, Q.X. Zhao, M. Willander, M.N. Morishita, T. Ohshima, H. Itoh, J. Isoya, E. Janzén, R. Yakimova
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Volume:
310
Year:
2008
Language:
english
Pages:
4
DOI:
10.1016/j.jcrysgro.2007.11.144
File:
PDF, 333 KB
english, 2008
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