In situ and real-time analysis of TGZM phenomena by...

Journal of Crystal Growth 2008 Vol. 310; Iss. 11

In situ and real-time analysis of TGZM phenomena by synchrotron X-ray radiography

H. Nguyen Thi, G. Reinhart, A. Buffet, T. Schenk, N. Mangelinck-Noël, H. Jung, N. Bergeon, B. Billia, J. Härtwig, J. Baruchel
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Volume:
310
Year:
2008
Language:
english
Pages:
9
DOI:
10.1016/j.jcrysgro.2008.01.041
File:
PDF, 1006 KB
english, 2008
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