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[IEEE 2014 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with NSREC 2014) - Paris, France (2014.7.14-2014.7.18)] 2014 IEEE Radiation Effects Data Workshop (REDW) - TID and SEE Characterization of Rad-Hardened 1.2GHz PLL IP from New ST CMOS 65nm Space Technology
Malou, Florence, Gasiot, Gilles, Chevallier, Remy, Dugoujon, Laurent, Roche, PhilippeYear:
2014
Language:
english
DOI:
10.1109/redw.2014.7004601
File:
PDF, 816 KB
english, 2014