The European Physical Journal D / Atomic, Molecular, Optical and Plasma Physics
2015 / 1 Vol. 69; Iss. 1
Sputter yield measurements of thin foils using scanning transmission ion microscopy
Eichhorn, Christoph, Manova, Darina, Feder, René, Wunderlich, Ralf, Nömayr, Christel, Zimmermann, Claus G., Neumann, HorstVolume:
69
Language:
english
Journal:
The European Physical Journal D
DOI:
10.1140/epjd/e2014-50552-1
Date:
January, 2015
File:
PDF, 1.42 MB
english, 2015