Optical Mapping of the Total EL2-Concentration in...

Optical Mapping of the Total EL2-Concentration in Semi-Insulating GaAs-Wafers

Zach, F. X., Winnacker, A.
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Volume:
28
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.28.957
Date:
June, 1989
File:
PDF, 763 KB
1989
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