Residual stress relaxation in GaN/sapphire circular pillars measured by Raman scattering spectroscopy
Samuel H. Margueron, Patrice Bourson, Simon Gautier, Ali Soltani, David Troadec, Jean-Claude De Jaeger, Andrei A. Sirenko, Abdallah OugazzadenVolume:
310
Year:
2008
Language:
english
Pages:
6
DOI:
10.1016/j.jcrysgro.2008.09.145
File:
PDF, 929 KB
english, 2008