Long-Term Reliability Tests for InGaAlP Visible Laser...

Japanese Journal of Applied Physics 1989 / 9 Vol. 28; Iss. Part 1, No

Long-Term Reliability Tests for InGaAlP Visible Laser Diodes

Ishikawa, Masayuki, Okuda, Hajime, Itaya, Kazuhiko, Shiozawa, Hideo, Uematsu, Yutaka
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Volume:
28
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.28.1615
Date:
September, 1989
File:
PDF, 919 KB
1989
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