ECS Transactions [ECS 220th ECS Meeting - Boston, MA (October 9 - October 14, 2011)] - A Deep-Level Transient Spectroscopy Comparison of the SiO
Simoen, Eddy, Rothschild, Aude, Vermang, Bart, Poortmans, Jef, Mertens, RobertYear:
2011
Language:
english
DOI:
10.1149/1.3628607
File:
PDF, 1.16 MB
english, 2011