![](/img/cover-not-exists.png)
Residual damage in B + and –implanted Si
Vandervorst, W., Houghton, D. C., Shepherd, F. R., Swanson, M. L., Plattner, H. H., Carpenter, G. J. C.Volume:
63
Language:
english
Journal:
Canadian Journal of Physics
DOI:
10.1139/p85-140
Date:
June, 1985
File:
PDF, 872 KB
english, 1985