Open-Circuit Voltage Decay (OCVD) Measurement Applied to...

Japanese Journal of Applied Physics 1990 / 1 Vol. 29; Iss. Part 2, No

Open-Circuit Voltage Decay (OCVD) Measurement Applied to Hydrogenated Amorphous Silicon Solar Cells

Sakata, Isao, Hayashi, Yutaka
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Volume:
29
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.29.L27
Date:
January, 1990
File:
PDF, 494 KB
1990
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