![](/img/cover-not-exists.png)
Assessment of defect reduction methods for nonpolar a-plane GaN grown on r-plane sapphire
C.F. Johnston, M.J. Kappers, M.A. Moram, J.L. Hollander, C.J. HumphreysVolume:
311
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.jcrysgro.2009.03.044
File:
PDF, 307 KB
english, 2009