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Remaining useful life prediction using prognostic methodology based on logical analysis of data and Kaplan–Meier estimation
Ragab, Ahmed, Ouali, Mohamed-Salah, Yacout, Soumaya, Osman, HanyVolume:
27
Language:
english
Journal:
Journal of Intelligent Manufacturing
DOI:
10.1007/s10845-014-0926-3
Date:
October, 2016
File:
PDF, 739 KB
english, 2016